The design of the ETL series of electronic technology test-bed is based on experimental teaching demands in the books-Analog Electronics Technology and Digital Electronic Technology.Three models were made by the company`s research and development department according to the every school`s needs and recommendations to the devices.
This equipment fully meets all the experimental contents and curriculum designs,as well as provide a good platform for teachers and graduate to develop new experiments or research works.
II.Features of Test-bed
1.Strong Science:With the development of subjects,electronics experimental content is gradually changing from a large number of verification experiments to the design of experiments,Comprehensive experiments.In spite of the face of conventional experimental content or a deeper level of teaching,the equipment is scientific and reasonable as well as avoids the equipment into a large and all-encompasing,resulting in a waste of funds.
2.Strong visualization:the clear pictures and reasonable panel layout and the "Plum Blossom From"design that are given a hand for the teachers and students` checking-line and will be very helpful to Train the students` manipulative ability.
3.Good reliability:silver-tube with the length of 2cm can be inserted in various components and there are more than 300 high-reliable locking-type anti-stack socket on the mother board. Wire are flexible contact with high reliability.
Relative temperature≤ 85°C
Equipment capacity: ≤ 200VA
This equipment can be free to design various experiments,the following experiments tothe institutions are only for reference.
Basic experiment of Analog Electronics Technology
1.common use of electronic devices
2.transistor common emitter single-tube amplifier
5.the emitter follower
7.Integrated Operational Amplifiers test
8.The basic application of Integrated Operational Amplifiers I-analog operational circuit
9.basic application of Integrated Operational Amplifiers II-APF
10.basic application of Integrated Operational Amplifiers III-voltage comparator
11.basic application of Integrated Operational Amplifiers IV-voltage waveform generato
12.RC sine wave oscillator
13.LC sine wave oscillator
14.voltage controlled oscillator
15.QTL power amplifier experiment
16.Integrated power amplifier experiment
17.Series transistor power supply
18.integrated power supply experiment
Analog electronic technology comprehensive experimental content
19.assembly and debugging of function signal generator
20.thyristor controlled rectifier circuit
21.Application experiment-the temperature monitoring and controlling circuit
22.the comprehensive experiment--the design and debugging of avometer
Basic experiment of Digital Electronics Technology
1.the transistor switching caracteristics,clipping and clamping device
2.logic function and parameters test of TTL
3.logic function and parameters test of CMOS logic gate-integrated
4.connecting and drive and integrated logic circuits
5.design and test of combinational logic circuits
6.decoder and its application
7.data selector and its application
8.Triggerand its Application
9.counter and its applications.
10.shift register and its application
11.pulse distributor and its application
12.D/A and A/D converters
14.the monostable trigger and the Schmitt trigger--with the pulse delay and waveform shaping.
15.555 time-base circuit and its applicaton
Comprehensive experiment of digital electronics technology
16.the multifunction device for intellectual competition-a comprehensive experiment
17.the electronic stopwatch-a comprehensiveexperiment
18.three half-DC Digital Voltmeter-a comprehensive experiment
19.Digital Cymometer-a comprehensive experiment
20.tug-of-war game-ainteresting and comprehensive experiment
21.RAM 2114 A and its application -a comprehensive experiment
22.EDA experiment and its application